Atomic Force Microscopy (AFM) is a powerful imaging and characterization technique used in various scientific fields, including nanotechnology, materials science, and biology. AFM allows for high-resolution imaging and analysis of sample surfaces at the nanoscale. It operates by scanning a sharp probe (typically a small cantilever with a sharp tip) across the surface of the specimen, measuring the interaction forces between the probe and the sample. These interactions are used to generate a topographic map of the surface, revealing details such as surface roughness, morphology, and even atomic-level features. Additionally, AFM can be used for various modes of operation, such as force spectroscopy, to investigate mechanical properties and interactions at the nanoscale. AFM has become an indispensable tool for nanoscale characterization and research.