In our laboratory, we use a series of home-built and commercial system, which are applied to measure the optical, electrical, magnetic and thermal properties in optoelectronic devices, including synchronous PL/EL measurements, transient EL measurements, temperature-dependent EL measurements.
Time-Correlated Single Photon Counting (TCSPC) facility is a sophisticated equipment setup used in various fields of research, such as biophysics, quantum optics, and material science. TCSPC enables precise measurement of ultrafast optical events and fluorescence phenomena with picosecond time resolution.
In our laboratory, we utilize a well-established low temperature magneto-optical system to obtain spectroscopic data about the temperature-dependent and magnetic field-dependent optoelectronic phenomena, such as photoluminescence (PL), electroluminescence (EL), photocurrent, and photo-induced absorption.
The LED (Light-Emitting Diode) test facility is a specialized setup designed for the evaluation and characterization of LEDs. LEDs are semiconductor devices that emit light when an electrical current is passed through them. This facility enables comprehensive testing of various properties, including luminous intensity,external quantum efficiency (EQE),color temperature, color rendering index and thermal behavior.
X-ray diffraction (XRD) is a versatile and widely used analytical technique for characterizing the atomic and molecular structure of materials, based on the principle of Bragg's law.
Ellipsometer facility is a highly versatile and accurate instrument used in materials science, surface characterization, and thin film analysis. design and characterization of advanced materials and devices.By analyzing the ellipsometric parameters, the thickness, refractive index, and extinction coefficient of thin films and surface layers can be obtained.
Atomic Force Microscopy (AFM) is a powerful imaging and characterization technique used in various scientific fields, including nanotechnology, materials science, and biology. AFM allows for high-resolution imaging and analysis of sample surfaces at the nanoscale.
PV characterization, referring to Photovoltaic characterization, is a crucial process in the evaluation and performance assessment of solar cells. PV characterization techniques include current-voltage (I-V) measurements, quantum efficiency measurements, capacitance-voltage (C-V) measurements, and spectral response measurements.
The PV aging test facility is a specialized setup used for evaluating the long-term durability and performance stability of solar cells.
UV ozone treatment involves exposing samples to UV light in the presence of ozone, effectively removing organic contaminants and creating a clean and reactive surface. Oxygen plasma treatment, on the other hand, uses ionized oxygen to modify the surface properties of materials, including cleaning, etching, and surface activation. The centrifuge component enables rapid sample separation or mixing through high-speed rotation.
The spincoater is used to evenly distribute liquid films onto a substrate surface by spinning it at high speeds. This technique enables precise control over film thickness and uniformity. The hot plate, on the other hand, provides controlled heating, allowing for the removal of solvents, curing of films, or annealing processes.
The glovebox provides a controlled environment with low levels of oxygen and moisture, allowing researchers to handle and manipulate sensitive or air-sensitive materials without contamination. The thermal evaporation system utilizes a resistive heating source to evaporate solid materials, which subsequently condense onto a substrate, forming thin films with precise control over thickness, composition, and uniformity.
